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JPS6484166A Expired / Lapsed JP ⏱️ 0.0 years remaining

Testing method for electronic circuit module

Assignee: Hitachi Ltd
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Filing: 1987-09-28
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Granted: —
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Expires: 2007-09-28
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Abstract

Abstract PURPOSE:To automate the determination of the kind of an electronic circuit module to be tested by varying a DC power source from a low level to a high level with respect, to the electronic circuit module to be tested. CONSTITUTION:A terminal is selected first. Then a voltage which is high enough to operate the input/output module 2 to be tested and low enough not to damage the module is applied. This voltage is outputted to a contact point 11 from a testing device main body 1 and applied to the module 2 through a terminal screw 9. The response of the module 2 to the application of this low voltage is measured automatically to confirm whether or not the module 2 functions electrically. The measurement result is compared with reference data by kinds which are measured in advance and a kind is determined when coincidence is obtained. Then a function test is conducted. If it is found that there is no coincident kind as a result of the measurement, the polarity is inverted and measurement is performed again. When a coincident kind is found, the kind is determined. When not, the DC voltage is increased and applied to the module 2 and measurement is performed.

Inventors

  • 👤 Hiroshi Ishimura
  • 👤 Shuzo Kato
  • 👤 Tsutomu Takahashi

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-01 07:36
CPC Classifications
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