Electrooptic device

Abstract

Abstract PURPOSE:To carry out the performance test of the built-in shift register circuit of an electrooptic device and to check disconnection of the signal and control lines of the device and short-circuit between the lines in a shorter inspection stage, by providing a switching transistor for inspection to at least the one-side terminating ends of the signal and control lines of the electrooptic device provided with the built-in shift register circuit. CONSTITUTION:A switching transistor (Tr) 6 is provided to the terminating ends of a signal line 2 connected with a shift register circuit 4 for picture element signal and a control line 3 connected with another shift register circuit 5 for control signal. By successively operating clock signals and data signals inputted to the common electrode of the switching Tr 6 and shift register circuit 4 and those inputted to the shift register circuit 5, the Tr 6 can be switched to the signal line 2 or control line 3 and, accordingly, the performance test of the driving circuit, disconnection checking in the signal and control lines 2 and 3, and short-circuit checking between the lines 2 and 3 can be performed.

Inventors

• 👤 Masahiko Oota
• 👤 昌彦 太田
• 👤 Satoshi Arai
• 👤 聡 荒井

Bibliographic Details