Lsi testing device

Abstract

Abstract PURPOSE:To attain an extremely efficient test by providing a means which identifies the kind of an LSI to be tested automatically and edits a program. CONSTITUTION:The LSI 1-1 to be tested is connected to hardware 1-3 for measurement through an adapter 1-2 and the identification of the LSI 1-1 is transmitted to an identification input means 1-4 through the hardware 1-3. A test program 1-8 stored in an auxiliary memory device 1-7, on the other hand, is sent to a test program memory 1-6 and then re-edited by a test program editing means 1-5 into a test program corresponding to the LSI 1-1 according to the LSI identification signal transmitted through the means 1-4. A test pattern file 1-9 stored in the device 1-7 is sent to a test pattern memory 1-10. Then, a test control part 1-11 controls the hardware 1-3 based on the re-edited test program by using the test pattern stored in the memory 1-10 to test the LSI 1-1.

Inventors

• 👤 Kazuhiro Kosugi
• 👤 小杉　一弘

Bibliographic Details