← Back to Patent Explorer
JPS63129668A Expired / Lapsed JP ⏱️ 0.0 years remaining

Thin film transistor

Assignee: Panasonic Holdings Corp
•
Filing: 1986-11-20
•
Granted: —
•
Expires: 2006-11-20
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract PURPOSE:To suppress thermal diffusion of electrode material and to implement a short channel, by forming the source and drain electrodes of a thin film transistor composed of a II-IV compound out of thin NiCr films. CONSTITUTION:An Al gate electrode 2 is formed on a glass substrate 1. A gate insulating film 3 consisting a thin Al2O3 film is formed thereon. Then a thin film 6 of CdSe or CdS, in which an adequate amount of In as impurities is added, is formed thereon. Thereafter, a thin NiCr film and a thin Au film are laminated as a source electrode 4 and a drain electrode 5. Since bonding between constituent elements is strong in NiCr, thermal diffusion is considerably suppressed in comparison with the base where only Cr is used, and a short channel can be implemented.

Inventors

  • 👤 Mikihiko Nishitani
  • 👤 幹彦 西谷
  • 👤 Masaharu Terauchi
  • 👤 正治 寺内
  • 👤 Koji Nomura
  • 👤 幸治 野村
  • 👤 Yoichi Harada
  • 👤 洋一 原田
  • 👤 Kuni Ogawa
  • 👤 小川 久仁
  • 👤 Noboru Yoshigami
  • 👤 由上 登
  • 👤 Kenji Kumabe
  • 👤 隈部 建治

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 19:24
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67

Claims Analysis

Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag