← Back to Patent Explorer
JPS6286864A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of soi structure misfet

Assignee: Fujitsu Ltd
•
Filing: 1985-10-14
•
Granted: —
•
Expires: 2005-10-14
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract PURPOSE:To improve the bondability of a single crystal silicon with an insulating film by laminating an oxide film and a nitride film on a substrate, then laminating a polysilicon layer in a groove formed with the nitride film, and emitting energy beam to form a single crystal. CONSTITUTION:After an SiO2 film 2 is formed on a silicon substrate 1, an Si3N4 film 9 is laminated. Then, a groove 10 is opened in the film 9 in a region corresponding to the channel region of a transistor formed on the insulating films to expose the film 2. Then, a polysilicon layer 3 is grown, argon ion laser is emitted to crystallize a single crystal region. A gate oxide film 5 and a gate electrode 6 are formed, a source region 7, a drain region 8 are formed to form the integrated circuit of a 3-dimensional structure. Thus, the strength against exfoliation can be raised.

Inventors

  • 👤 Seiichiro Kawamura
  • 👤 河村 誠一郎

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 20:46
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67

Claims Analysis

Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.

References Cited (Backward Citations)

No citation records indexed.

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag