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JPS6242532A Expired / Lapsed JP ⏱️ 0.0 years remaining

Surface treating method of compound semiconductor

Assignee: Panasonic Holdings Corp
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Filing: 1985-08-20
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Granted: —
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Expires: 2005-08-20
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Abstract

Abstract PURPOSE:To remove a transforming layer in a GaAlAs layer, and to form a clean smooth surface by etching one part of a GaAs layer on the GaAlAs layer by using an NH4OH group etching liquid and treating the surface by a H2SO4 group etching liquid. CONSTITUTION:An n-type GaAs buffer layer 2, an n-type AlGaAs clad layer 3, an AlGaAs active layer 4, a p-type AlGaAs clad layer 5 and an n-type GaAs current stopping layer 6 are crystal-grown on an n-type GaAs substrate 1 in succession. A photo-resist film 7 is applied onto the stopping layer 6, and a striped window is bored to the film 7 in parallel with the <110> direction. One part of a wafer is etched selectively by employing an NH4OH group etching liquid at a predetermined ratio. One part of the wafer is etched, the surface is treated by a H2SO4 group etching liquid, and a clean and smooth surface is shaped onto the stopping layer 6. The GaAlAs layers are removed, and the clean and smooth surface is formed.

Inventors

  • 👤 Akio Yoshikawa
  • 👤 昭男 吉川
  • 👤 Masanori Hirose
  • 👤 広瀬 正則
  • 👤 Takashi Sugino
  • 👤 隆 杉野

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 11:01
CPC Classifications
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References Cited (Backward Citations)

JPS55111192A Cited
JPS5867078A Cited
JPS60138911A Cited

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