Spectral measuring instrument

Abstract

Abstract PURPOSE:To obtain the real light intensity of each wavelength which does not contain the influence of light of other wavelength from the output of each photodetecting means which contains the influence of the light of other wavelength by solving simultaneous equations which hold for the output of each photodetecting means and the relation between spectral sensitivity information and the light intensity of each section wavelength range. CONSTITUTION:Incident light is diffracted F1 spectrally and photodetected PDi. A storage means B1J is stored with spectral sensitivity information aij corresponding to integral values by integrating the respective spectral sensitivity values Si(lambda) of the spectral detector consisting of a spectral diffracting means F1 and respective photodetecting means PDi by section wavelength areas obtained by dividing a measured wavelength area so as to obtain the real light intensity Pi from the outputs Oi of the photodetecting means PDi. An arithmetic means MTX solves the simultaneous equations which hold for the outputs Oi of the respective photodetecting means PDi and the relation between the spectral sensitivity information aij stored in said storage means B1J and the light intensity Pi of said each section wavelength area, thereby obtaining the real light intensity Pi of each wavelength.

Inventors

• 👤 Nobukazu Kawagoe
• 👤 宣和 川越
• 👤 Masahito Inaba
• 👤 稲葉　政仁

Bibliographic Details