Ic tester

Abstract

Abstract PURPOSE:To perform the test of plural ICs with the same structure quickly and to improve a test throughput by controlling input/output gates corresponding to the plural ICs of a tester with the different timings and composing and deciding the IC outputs with the same level. CONSTITUTION:The respective input gates and output gates 22, 23 and 28, 31-26, 27 and 30, 32 of the ICs 38-40 with the same structure are controlled by signals with the different timings from a timing generating part 37 of a tester part 21. Then, the outputs of ICs with the same level only are composed by signal composing circuits 34, 35 and the qualities of ICs 38-40 are decided based on a result of the composition with a quality deciding part 36. The test of the plural ICs with the same structure is performed quickly by this parallel test and the test throughput per unit time is improved.

Inventors

• 👤 Toshiaki Nozaki
• 👤 野崎　俊明

Bibliographic Details