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JPS6180881A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor laser device

Assignee: Toshiba Corp
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Filing: 1984-09-28
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Granted: —
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Expires: 2004-09-28
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Abstract

Abstract PURPOSE:To realize a semiconductor laser device capable of a lower threshold value with help of built-in waveguide effect attributable to the difference in effective refractive indexes by a method wherein two coating layers are formed, with the first coating layer provided with a refractive index higher than that of an clad layer and occupying the entire region except along the sides of a stripe-shaped groove and the second coating layer provided with a refractive index lower than that of the first coating layer. CONSTITUTION:On an n-GaAs substrate 21 of the facial orientation (100), a clad layer 22, undoped activation layer 23, p-clad layer 24, and n-GaAs current-impeding layer 25 are grown in that order. A photoresist 31 is placed on the current-impeding layer 25 by application, and a stripe-shaped window is provided. The current-impeding layer 25 is subjected to selective etching with the stripe-shaped window serving as a mask. Further, the clad layer 24 is exposed to etching until a stripe-shaped groove 32 is formed. On the entire surface, a first coating layer 26, second coating layer 27, and contact layer 28 are grown. On the contact layer 28, a Cr-Au electrode layer 29 is formed and, on the lower surface of the substrate 21, an Au-Ge electrode layer 30 is formed. An element obtained in this way operates on a threshold current that is as low as 35mA, and has an excellent differential.quantative efficiency of 50%.

Inventors

  • 👤 Naoto Mogi
  • 👤 茂木 直人
  • 👤 Motoyuki Yamamoto
  • 👤 山本 基幸
  • 👤 Yukio Watanabe
  • 👤 幸雄 渡辺

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 00:31
CPC Classifications
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References Cited (Backward Citations)

JP3110949U Cited
JP2009059052A Cited
US20090176383A1 Cited
JP2011113727A Cited
KR101204510B1 Cited

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