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JPS6149474A Expired / Lapsed JP ⏱️ 0.0 years remaining

Field-effect transistor and manufacture thereof

Assignee: Panasonic Holdings Corp
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Filing: 1984-08-17
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Granted: —
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Expires: 2004-08-17
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Abstract

Abstract PURPOSE:To shorten a switching time by attaching a metal or a metallic compound forming an ohmic contact with a diffusion region as a source electrode and a Schottky contact with a substrate as a drain electrode. CONSTITUTION:P type Si diffusion layers 2 for shaping channels and N type Si diffusion layers as source electrodes in the layers 2 are formed to an N type Si substrate 1 as a drain electrode. An SiO2 film 5 and a polycrystalline Si film 4 as a gate electrode are shaped extending over the substrate 1, the layers 2 and the layers 3 on the substrate 1. Silicide layers 10 are formed extending over the substrate 1, the layers 2 and the layers 3 where separate from the film 4, and the layers 10 shape ohmic contacts with the layers 3 and Schottky contacts with the substrate 1. Accordingly, when potential on the substrate 1 side is brought to a negative value to the layer 3 side, the forward rise voltage of a Schottky junction is made smaller than that of a P-N junction, thus concentrating currents flowing through the drain electrode from the layer 10 to the Schottky junction, then shortening a switching time.

Inventors

  • 👤 Akio Shimano
  • 👤 嶋野 彰夫
  • 👤 Daisuke Ueda
  • 👤 大助 上田

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 15:40
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/028; H10D30/0291; H10D84/00; H10D84/101; H10D84/141; H10D84/146; H10D64/00; H10D64/60; H10D64/66; H10D64/661; H10D64/662; H10D64/663

Claims Analysis

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References Cited (Backward Citations)

JPS58106872A Cited

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