Apparatus for automatically testing ic

Abstract

Abstract PURPOSE:To make it possible to efficiently perform highly reliable work, by testing ICs by falling the same one at a time and sorting the said ICs on the basis of the quality thereof so as to bring the same to predetermined areas. CONSTITUTION:An automatic testing apparatus 5 allows ICs 1 received in a stick 6a to fall through a guide groove 7a and separates ICs 1 continuously received in the guide groove 7a by falling in a take-out part 8 one at a time to fall and send the same to a test part 9. After various required tests were performed by an apparatus, said ICs are fallen and sorted corresponding to the quality of the tested ICs in a sorting part 10 to be received in predetermined areas.

Inventors

• 👤 Koichiro Senda
• 👤 千田　孝一郎

Bibliographic Details