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JPS60876A Expired / Lapsed JP ⏱️ 0.0 years remaining

Method and device for producing ultra-pure water having low specific resistance used for washing of wafer, or the like

Assignee: Nomura Micro Science Co Ltd
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Filing: 1983-05-27
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Granted: —
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Expires: 2003-05-27
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Abstract

Abstract PURPOSE:To maintain a specific resistance value of ultra-pure water to be ejected onto a wafer surface in a specific range at all times by controlling the blowing rate of the carbon dioxide to be blown and melted into the ultra-pure water to a constant rate. CONSTITUTION:Gaseous carbon dioxide is passed through a filter 5 to have the much higher purity and is then blown through a gas flow passage 10 into an ultra-pure water flow passage 11. A specific resistance value 16 which is the input to a specific resistance adjuster 4 and is the input to a specific resistance value sensor 14 and a specific resistance alarm 15 is disposed on the down stream of the passage 11. When the output from the sensor 14 exceeds the upper limit value in a specific range, a solenoid valve 3 is opened and when the value is a lower limit value or below, said valve is closed. The blowing rate of the gaseous carbon dioxide is thus controlled to a constant rate and the ultra-pure water having a low specific resistance is stably obtd.

Inventors

  • 👤 Yoshiharu Oota
  • 👤 太田 嘉治
  • 👤 Takeo Makabe
  • 👤 真壁 猛夫
  • 👤 Toshiji Sawada
  • 👤 沢田 稔二

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-01 11:40
CPC Classifications
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References Cited (Backward Citations)

JPS59166285A Cited

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