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JPS6077482A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor laser

Assignee: NEC Corp
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Filing: 1983-10-04
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Granted: —
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Expires: 2003-10-04
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Abstract

Abstract PURPOSE:To enhance the reliability with excellent mass productivity and low oscillating threshold value by employing a MO-CVD method in the growth of a crystal after forming a current block layer. CONSTITUTION:A P type Al0.4Ga0.6As layer 21 has a mesa 22 from the shape of a mesa 20 of a GaAs substrate 19. Then, an etching mask 23 is formed on the surface of a P type Al0.4Ga0.6As layer 21 except the mesa 22, and etched, then etched with fluoric acid to expose the mesa 11 in the desired height. Thus, a substrate crystal having a current block layer is formed, then an N type Al0.3Ga0.7As layer 24, a GaAs active layer 25, a P type Al0.3Ga0.7As layer 26 and a P type GaAs layer 27 are formed by the MO-CVD method. Eventually, a P type electrode 28 and N type electrode 29 are formed, to complete a semiconductor laser. Thus, excellent mass productivity, low oscillating threshold and high reliability can be provided.

Inventors

  • 👤 Masaaki Nidou
  • 👤 正明 仁道

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-30 15:53
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/20; H01S5/22; H01S5/223; H01S5/2232; H01S5/2234; H01S5/2235; H01S5/2237

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