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JPS60254752A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1984-05-31
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Granted: —
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Expires: 2004-05-31
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Abstract

Abstract PURPOSE:To form a high bump (higher than 10mum), by combining a two-layer resist lift-off method and an evaporating film, and manufacturing the face-down bonding-bump. CONSTITUTION:A passivation film 3 is attached to the surface of a substrate 1 including a base electrode 2 to the thickness of 5mum. The passivation film 3 on the base electrode 2 is removed by a dry etching method and the like, and two- layer resist films 4 and 5 are formed. Then, a bump metal is evaporated and two-layer resist lift-off is performed. The possivation film 3 is further etched. Thus a bump 6 is formed. The height of the obtained bump (h) becomes happrox.=d4+ d5+(do-dp). The height can be made high in comparison with the height obtained by a conventional method.

Inventors

  • 👤 Shoji Nomura
  • 👤 昭司 野村
  • 👤 Toru Maekawa
  • 👤 前川 通

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 18:40
CPC Classifications
H; H10; H10P; H10P76/00; H10P76/20; H10P76/204; H10P76/2041; H10W; H10W72/00; H10W72/01; H10W72/012; H10W72/20; H10W72/251

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