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JPS6014168A Expired / Lapsed JP ⏱️ 0.0 years remaining

Ultrasonic examination device

Assignee: Mitsubishi Electric Corp
•
Filing: 1983-07-06
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Granted: —
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Expires: 2003-07-06
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Abstract

Abstract PURPOSE:To correct a variance of transmitting circuits or the like by providing an input selecting circuit between each ultrasonic vibrator and each receiving circuit and switching the output of the transmitting circuit and the receiving signal from a material to be examined to input them to the receiving circuit. CONSTITUTION:In the ultrasonic examination device consisting of an ultrasonic probe 1, transmitting circuits 2a-2n, transmission delay circuits 3a-3n, receiving circuits 4a-4n, reception delay circuits 5a-5n, a delay time control circuit 6, an adding circuit 8, a reception level detecting circuit 12, a discriminating circuit 13, etc., input selecting circuits 20a-20n are provided between ultrasonic vibrators 1a-1n constituting the ultrasonic probe 1 and receiving circuits 4a-4n respectively. Input selecting circuits 20a-20n switch outputs of transmitting circuits 2a-2n and the receiving signal from the material to be examined and output them to receiving circuits 4a-4n. Variances of sensitivity of transmission delay circuits, transmitting circuits, transmission cables, and vibrators are corrected for individual vibrators.

Inventors

  • 👤 Kazumi Sugino
  • 👤 杉野 一美
  • 👤 Hiroshi Ichikawa
  • 👤 宏 市川

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 23:51
CPC Classifications
G; G01; G01N; G01N29/00; G01N29/22; G01N29/30; G01N2291/00; G01N2291/02; G01N2291/028; G01N2291/02854

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