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JPS59968A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1982-06-25
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Granted: —
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Expires: 2002-06-25
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Abstract

Abstract PURPOSE:To prevent an electron mobility in a high electric field from decreasing in a high electron mobility transistor by increasing the difference of the electron affinity in a hetero junction between a channel layer and an electron supply layer. CONSTITUTION:A GaAs (channel) layer 12, and an AlxGa1-xAs layer which has a region 13 having no impurity and an N type region 14 are sequentially formed on a GaAs substrate 11. Si is introduced as an impurity to the region 14. Then, AuGe/Au<2> layer is deposited on the position where a source electrode 15 and a drain electrode 16 are arranged, and a resistive connection region 17 to the layer 12 is formed. Then, a gate electrode 18 is formed.

Inventors

  • 👤 Tomonori Ishikawa
  • 👤 石川 知則
  • 👤 Sukehisa Hiyamizu
  • 👤 冷水 佐寿

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-30 21:33
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/40; H10D30/47; H10D30/471; H10D30/475; H10D30/4755

Claims Analysis

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References Cited (Backward Citations)

JPS58147158A Cited

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