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JPS5944831A Expired / Lapsed JP ⏱️ 0.0 years remaining

Deposition of thin film

Assignee: Toshiba Corp
•
Filing: 1982-09-07
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Granted: —
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Expires: 2002-09-07
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Abstract

Abstract PURPOSE:To deposit an insulating film on an uneven surface of a substrate with a good step coverage by performing etching and deposition at the same time and making deposition speed faster than etching speed. CONSTITUTION:An Al-1%Si alloy film 14 of 1mum thickness is deposited on a P type Si substrate 12 by a magnetron sputtering equipment and a resistor pattern 15 of 1mum width for Al wiring is also formed. Then Al film 14 is etched using the resistor pattern 15 as a masking and the resistor pattern 15 is removed. Then a silicon oxide film 16 is deposited by ion plating method in the atmosphere of O2/CF4 which contains CF4 whose floating ratio against O2 is 1/10. Then the second Al film 17 is deposited by magnetron sputtering method.

Inventors

  • 👤 Tsunetoshi Arikado
  • 👤 経敏 有門

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-30 09:08
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/60

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