Test signal generating method for peripheral equipment

Abstract

Abstract PURPOSE:To easily perform the test for a ticket machine, etc. in a station without connecting an actual machine, by generating a test signal for a low speed peripheral equipment through the use of a microprocessor chip on the market and a small capacity of a memory. CONSTITUTION:A microcomputer device consists of a CPU1 consisting of a microprocessor IC, an RAM2 and a console 3. A program is executed, an address register is set to the head address of a data area, the address register is incremented, and an initial logical data ''0'' is read out. When data, e.g., 08 is read out at the data of the next address, the number of interruptions is counted and when the number of interruptions reach 8 times, the output logic is inverted from ''0'' to ''1''. When the end code FF is read out, the address counter is returned to the initial address and the test signal of the same pattern is outputted.

Inventors

• 👤 Makoto Kawai
• 👤 川井　信
• 👤 Kesamitsu Koike
• 👤 小池　袈裟光

Bibliographic Details