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JPS5857731A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Denso Corp
•
Filing: 1981-10-01
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Granted: —
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Expires: 2001-10-01
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Abstract

Abstract PURPOSE:To obtain a high moisture-proof device, by forming a wiring of Al, etc. on a semiconductor substrate whereon an element region is provided, covering the other part than a wire bonding region with an insulating film, then connecting a wire to the bonding region, and thereafter changing the wiring part exposed in the periphery thereof into an Al2O3. CONSTITUTION:An SiO2 insulating film 3 is adhered on an Si substrate 1 whereon the element region 2 is provided, an aperture is opened corresponded to the region 2, and the wiring 4 constituted of Al or Al alloy which contacts the region 2 is formed by being extended on the film 3. Next, a surface protection film 6 of SiO2 or SiN is formed over the entire surface, an aperture part 5A to mount the metallic wire 7 is opened, then the back surface of the substrate 1 is fixed on a lead frame 8, and thereafter the wiring 4 exposed to the aperture part 5A is connected to the frame 8 by using the wire 7. Thereafter, with the frame 8 as the anode, anodic formation is performed resulting in the conversion of the surface of the wiring 4 still exposed in the periphery of the wire 7 into a non-porous Al2O3 film 9.

Inventors

  • 👤 Toshio Sonobe
  • 👤 園部 俊夫
  • 👤 Makio Iida
  • 👤 飯田 眞喜男

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-05 10:26
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/90; H10W70/00; H10W70/60; H10W72/01; H10W72/015; H10W72/01515; H10W72/071; H10W72/075; H10W72/07551; H10W72/50; H10W72/531; H10W72/536; H10W72/5363; H10W72/551; H10W72/552; H10W72/59; H10W72/951; H10W72/952; H10W72/981; H10W72/983; H10W90/00; H10W90/701; H10W90/751; H10W90/756

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