JPS583256A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Lsi chip
Assignee: Fujitsu Ltd
•
Filing: 1981-06-30
•
Granted: —
•
Expires: 2001-06-30
Abstract
Abstract PURPOSE:To enable to automat the testing step of an LSI chip by providing external terminals for an IC structure identifying code pattern and an identification code output in the chip. CONSTITUTION:An identification code pattern representing the logic structure of an IC is formed in an LSI chip, and an external terminal 3 (4 designates an external terminal for a general signal) for reading externally the identification code is provided. In this manner, the testing step of the chip can be automated.
Inventors
- 👤 Kazuya Kobayashi
- 👤 小林 和弥
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-10-31 07:34
CPC Classifications
H; H10; H10W; H10W46/00; H10W46/401; H10W46/403; H10W46/601
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.