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JPS5819476A Expired / Lapsed JP ⏱️ 0.0 years remaining

Dry etching method for chromium film

Assignee: Mitsubishi Electric Corp
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Filing: 1981-07-24
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Granted: —
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Expires: 2001-07-24
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Abstract

Abstract PURPOSE:To perform etching with superior dimensional accuracy by carrying out etching for forming a desired pattern on a mask plate using a chromium film by dry etching using a gaseous mixture of a gas contg. halogen with gaseous CO. CONSTITUTION:A mask plate using a single-layer or multilayer film of chromium or chromium oxide as a photomask material in the manufacture of a semiconductor device is etched to form a desired pattern. At this time, by dry etching such as gas plasma etching or reactive ion etching using a gaseous mixture of a gas contg. halogen, especially Cl such as CCl4 or chloroform with gaseous CO, the mask plate using the chromium film is etched. A chromium film pattern with high dimensional accuracy is easily obtd.

Inventors

  • 👤 Yoshimare Suzuki
  • 👤 鈴木 淑希
  • 👤 Teruhiko Yamazaki
  • 👤 山崎 照彦

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 18:35
CPC Classifications
C; C23; C23F; C23F4/00

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