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JPS5791518A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Toshiba Corp
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Filing: 1980-11-28
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Granted: —
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Expires: 2000-11-28
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Abstract

Abstract PURPOSE:To increase the diameters of the crystalline grains by covering an insulating film having unevenness on a substrate with a semiconductor film and ion injecting before or after annealing the film with a laser. CONSTITUTION:An oxidized Si 2 is covered on a substrate 1 formed of Si, or glass, fine uneven structure is formed by photolithographic technique, a polycrystalline Si 3 is covered, ions 4 of B, or P are implanted, and the film is locally or entirely annealed with a laser light 5, thereby increasing the crystalline grain diameter. In this manner, the characteristics of a semiconductor element can be enhanced, and the resistance of the polycrystalline Si can be lowered.

Inventors

  • 👤 Keiji Kobayashi

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 01:52
CPC Classifications
H; H10; H10P; H10P34/00; H10P34/40; H10P34/42

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