Semiconductor device

Abstract

Abstract PURPOSE:To easily execute a code test, by providing a code test mechanism in the inside of an LSI containing a ROM in one chip. CONSTITUTION:An ROM code test part 9 is provided in the inside of a semiconductor device (LSI) 1 containing an ROM2. The device becomes a test mode by a signal 15, and a test control part 4 increases an address designating part 3 in order from ''0'' address. All parallel outputs of ond word by one for the ROM2 are converted to a series signal through a multiplexer 6 and a parallel-series converter 10, are inputted to a shift register 11, and are compressed to a data. Its output data is compared with a final processing data of a data register 12 by a coincidence detecting circuit 13, and a signal of a decision result is sent out to an output terminal 16. In this way, a code test of the ROM2 can be executed easily.

Inventors

• 👤 Kazuo Hayashi
• 👤 Kunihiro Yamada

Bibliographic Details