Test input circuit of microcomputer

Abstract

Abstract PURPOSE:To add one terminal that a user can use by decreasing the number of terminals exclusively used for a chip test by making both a test information input terminal required for the chip test, and a synchronizing signal output terminal into one terminal. CONSTITUTION:A common-use terminal 1 for the test information input terminal and a synchronizing signal output terminal of a one-chip microcomputer, when a user uses it normally, serves as the test information input terminal to receive information showing a no-test state. In a chip test, the terminal 1 functions as both the test information terminal and synchronizing signal output terminal. This synchronizing signal output terminal is used for synchronizing pulses of an LSI tester. Thus, the number of test information input terminals is decreased by one, and the terminal that the user can use is added by one.

Inventors

• 👤 Akiyoshi Hatada

Bibliographic Details