Inspection method of magnetic bubble memory

Abstract

Abstract PURPOSE: To reduce the inspection time, by writing in "1" bubble which is 5% or less in the bit number of minor loop, and reading out "0" bubble through the operation of transfer gate after reading out "1" bubble. CONSTITUTION: In inspecting the memory chip 1 having the major loop 11 and a plurality of minor loops 10, "1" bubble 17 5% or less in the bit number is written in the minor loop 10 with a suitable interval. In reading out, first "1" bubble 17 is read out and then "0" bubble is read out by operating the transfer gate 15. Further, "1" and "0" bubbles read out are compared with the written-in data to inspect the presence of error. Accordingly, in reading out "0" bubble, since the transfer gate 15 can continuously be operated, the inspection time can remarkably be reduced. COPYRIGHT: (C)1981,JPO&Japio

Inventors

• 👤 Yasushi Sato
• 👤 Kengo Nogai
• 👤 Seiichi Iwasa

Bibliographic Details