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JPS5680133A Expired / Lapsed JP ⏱️ 0.0 years remaining

Formation of pattern

Assignee: CHIYOU LSI GIJUTSU KENKYU KUMIAI
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Filing: 1979-12-06
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Granted: —
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Expires: 1999-12-06
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Abstract

Abstract PURPOSE:To form a fine pattern with high accuracy and without causing the breakage of wire or the like by providing a layer preventing a resist from the reflection of light for exposure between a formed substance and the resist. CONSTITUTION:A formed substance 2 having high reflection characteristics such as Al or the like is provided on a substrate 1. And a coating layer 3 consisting of a substance (for example, poly Si or the like) having a small reflectivity or high light absorption is provided on the formed substance 2 surface when exposure is applied by masks 6 by using a photoresist 4. In this way, the irradiated light is absorbed in the layer 3 or multiply reflected. Therefore, regions 5 not to be exposed will not undesirably exposed and a fine pattern will be obtained with high accuracy.

Inventors

  • 👤 Nobuhiro Endo
  • 👤 Kazuo Kamimura

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-05 19:33
CPC Classifications
H; H10; H10P; H10P95/00

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS4994267A Cited
JPS5158072A Cited

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