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JPS5655050A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor device

Assignee: Fujitsu Ltd
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Filing: 1979-10-11
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Granted: —
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Expires: 1999-10-11
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Abstract

Abstract PURPOSE:To stabilize a coated pattern of a semiconductor device by patterning a film coated on a semiconductor substrate in a gas plasma containing chlorine where the film contains aluminum or mainly aluminum as essential ingredient and irradiating the gas plasma containing F in an apparatus. CONSTITUTION:A semiconductor substrate 6 formed with a wiring Al-Cu alloy (containing 4% of copper) film is contained in a reaction container, BCl3 gas is introduced thereinto, high frequency wave is applied, and a gas plasma contaning chlorine is generated. The alloy is etched in a predetermined pattern, CF4 is introduced into an apparatus consectively, high frequency wave is applied, and gas plasma containing F is exposed with the substrate to be treated. Even if it is thus exposed with atmospheric air, the Al-Cu wiring pattern is not corroded, but reliable and stable wiring electrode can be finely formed.

Inventors

  • 👤 Moritaka Nakamura
  • 👤 Chuichi Takada

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-01 09:47
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267

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