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JPS5629340A Expired / Lapsed JP ⏱️ 0.0 years remaining

Formation of electrode on semiconductor element

Assignee: Toshiba Corp
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Filing: 1979-08-20
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Granted: —
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Expires: 1999-08-20
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Abstract

Abstract PURPOSE:To eliminate separation of electrodes occurred owing to interposition of an oxide layer in a semiconductor element by forming an ohmic electrode on a semiconductor substrate and then etching it to remove exposed surface layer thereof. CONSTITUTION:AuBe alloy layer and AuSi alloy layer 2 are formed on the exposed surfaces of P type region 1p and N type region 1n of a GaP substrate 1. The layer 2 is heated in N2 gas to form an ohmic electrode 2' thereon. In this manner Be, Ga oxide layer 3 is formed on the exposed surface layer of the electrode 2'. Then, the substrate 1 is heated in hydrochloric acid, is cooled, and dried. An Au layer is evaporated subsequently on the electrode 2' to form in predetermined electrode pattern thereon as a bonding electrode 4. Resultantly, it can eliminate separation of electrode produced owing to interposition of an oxide layer to improve the bonding efficiency and the yield thereof.

Inventors

  • 👤 Hirohisa Abe

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-01 21:10
CPC Classifications
H; H10; H10W; H10W72/00; H10W72/30; H10W72/071; H10W72/073; H10W72/07331; H10W72/07336; H10W72/07337

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