← Back to Patent Explorer
JPS56122166A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Toshiba Corp
•
Filing: 1980-02-29
•
Granted: —
•
Expires: 2000-02-29
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract PURPOSE:To decrease a finger voltage of a semiconductor device by forming a circuit impedance at a regenerating gate and other gate of a semiconductor controlled rectifier, thereby controlling a current and thus increasing the di/dt withstand amount. CONSTITUTION:A thyristor 21 is formed of a main thyristor 22 and an auxiliary unit 23 formed of PNPN junction, and a regenerative gate G2 is so formed on the N type emitter layer of the auxiliary unit 23 as to surround a cathode K. A gate G0 is formed through a di/dt withstand amount remedy circuit impedance r1 on a P type base layer 24, a gate G1 is formed through a finger voltage remedy circuit impedance r2 at a position confronted to the gate G0, and the current of the gate G0 is branched. Thus, the di/dt withstand amount is increased, a breakdown can be prevented and simultaneously the finger voltage is decreased, and when a plurality of gates are connected in parallel, they can be simultaneously turned ON.

Inventors

  • 👤 Yoichi Araki
  • 👤 Toshio Ogawa
  • 👤 Kazuyuki Nakajima

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 17:19
CPC Classifications
H; H10; H10D; H10D64/00; H10D64/20; H10D64/27; H10D64/291

Claims Analysis

Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.

References Cited (Backward Citations)

JPS473536U Cited
JPS5022399A Cited
JPS5138986A Cited
JPS555270A Cited

USPTO Annuity & Maintenance Windows

Maintenance schedule is calculated for granted US utility patents.

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag