Thickness measuring device of radiation

Abstract

Abstract PURPOSE:To enable to confirm the failure of a reference plate itself ahead the measurement of a plate thickness, by storing the calibration curve in advance through a reference plate, and comparing the detected value of the reference plate with the curve every measurement. CONSTITUTION:A reference plate 2a is inserted into beams of a radiation ray source 1 with the driving instruction of an operation processing circuit 6. The output of a detector 3 is fed to an operation processing circuit 6 via a preamplifier 4 and logarithmic amplifier 5, it is compared with a signal from a plate thickness setter 8, and the amount of correction is stored in a storage device 7. A calibration curve is made through a plurality of reference plates in advance and it is stored in the storage device 7. Then, in the measurement of a plate thickness of object to be measured, the measurement of plate thickness is made by using the reference plate in advance and it is compared with the calibration curve. If the result of comparison exceeds the permissible range of error, the operation processing circuit 6 makes an alarm. Thus, ahead the measurement of the plate thickness, the failure of reference plates themselves can be confirmed.

Inventors

• 👤 Tatsuo Tsujii
• 👤 Takaaki Okino

Bibliographic Details