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JPS5568650A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacturing method of semiconductor device

Assignee: Hitachi Ltd
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Filing: 1978-11-20
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Granted: —
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Expires: 1998-11-20
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Abstract

Abstract PURPOSE: To easily form both a mask arranging step and a channel stopper on the surface of a semiconductor substrate under self-arrangement, by utilizing the difference in impurity concentration. CONSTITUTION: An n + -layer 2 is provided on a p-type silicon substrate 1. When the layer 2 is oxidized at a low temperature under steam, oxide films 3, 4 are produced thick on the n + -layer 2 and thin on the p-type substrate 1, respectively. Boron ions are implanted through the thin film 4 to selectively make a thin p-layer 5 under self-arrangement. When a separating oxide film is produced in an epitaxial layer 6 on the p-layer 5, the layer 5 effectively acts as a channel stopper. A mask arranging step 7 is made on the epitaxial layer on the n + -layer 2 under self-arrangement. COPYRIGHT: (C)1980,JPO&Japio

Inventors

  • 👤 Masahiko Kogirima
  • 👤 Kunihiro Yagi
  • 👤 Masao Tamura
  • 👤 Michiyoshi Maki

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 07:19
CPC Classifications
—

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