Pattern generating device

Abstract

Abstract PURPOSE: To form the testing impress pattern and decrease the memory capacity of the pattern file by providing an operation register and the output register and carrying out the operation in accordance with the memory content of the control file. CONSTITUTION: The reading order change command of the impressing pattern memorized in the pattern file 11 and the impressing pattern memorized in the command portion 13 in the control file 12 are simultaneously read out, the data is memorized in the operand portion 14 and impressed to the IC 16 to be tested through the format control portion 15. The output of IC 16 to be tested is compared with the expectation pattern memorized in the pattern file 11. In accordance with the operation specification memorized in the operation pattern generation control portion 17 and the register specification, the operation is carried out by the operation registers 1xW3x, the operation result is outputted from the output registers 1yW3y and similarly impressed to IC 16 to be tested. COPYRIGHT: (C)1980,JPO&Japio

Inventors

• 👤 Junji Nishiura
• 👤 Tadashi Ikeda

Bibliographic Details