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JPS5544985A Expired / Lapsed JP ⏱️ 0.0 years remaining

Measuring device

Assignee: Mitsubishi Electric Corp
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Filing: 1978-09-27
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Granted: —
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Expires: 1998-09-27
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Abstract

Abstract PURPOSE: To provide a measuring device, which can measure the longitudinal and transverse sizes at the same time, by providing a half-mirror in an optical system and by arranging a line sensor in a manner to intersect the reflecting optical pass and the transmitting optical path of the half-mirror. CONSTITUTION: The image of an object 1 is focused on both first and second line sensors 3 and 5 through an optical system having a lens 2 and a half mirror 6 such that the longitudinal and transverse directions to be measured are aligned with the lines for measurement. As a result, the width A of object 1 is measured by the first line sensor, whereas the length B is measured by the second line sensor. Thus, the output signals are processed by their respective signal processors thereby to make it possible to determine the processing rate. COPYRIGHT: (C)1980,JPO&Japio

Inventors

  • 👤 Shiyuuji Itou

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-02 17:32
CPC Classifications
—

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