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JPS5543844A Expired / Lapsed JP ⏱️ 0.0 years remaining

Method and apparatus for photoresist sensitizing process

Assignee: Hitachi Ltd
•
Filing: 1978-09-25
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Granted: —
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Expires: 1998-09-25
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Abstract

Abstract PURPOSE: To improve a precision of photoresist process by providing a precise thermostat on a portion where to mount photomask and wafer and also on a portion where to enclose unsensitized wafer. CONSTITUTION: There is provided a precise thermostat in an area A including a stage part 4 to mount a wafer for photoresist sensitizing process and a photomask 5 holding part and also in an area B to enclose a multitude of unsensitized wafers at a stage preceding to photoresist sensitizing process, and temperatures on those portions and room temperature are adjusted to coincide with a set temperature. A photoresist error to occur according to thermal expansion is minimized consequently to improve a pattern precision by photoresist process. COPYRIGHT: (C)1980,JPO&Japio

Inventors

  • 👤 Kazutaka Narita

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-06 17:53
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/708; G03F7/70858; G03F7/70866; G03F7/70875

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS4958770A Cited
JPS5225576A Cited

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