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JPS548474A Expired / Lapsed JP ⏱️ 0.0 years remaining

Gate protection unit

Assignee: Hitachi Ltd
•
Filing: 1977-06-22
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Granted: —
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Expires: 1997-06-22
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Abstract

Abstract PURPOSE:To remarkable increase the static breakdown strength of MOSFET gate, by forming the gate region thinner and fitting electrodes at the both ends, and by connecting one to the gate electrode of MOSFET and by taking another as the gate input terminal, in the gate protection unit having the diodes in anti parallel connection.

Inventors

  • 👤 Isao Yoshida
  • 👤 Shigeo Ishii
  • 👤 Masatomo Furuumi
  • 👤 Masaru Takeuchi

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-28 17:09
CPC Classifications
H; H10; H10D; H10D89/00; H10D89/60; H10D89/601

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