JPS5264894A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
X-ray dislocation image acquisition equipment using x-ray microbeam
Assignee: Jeol Ltd
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Filing: 1975-11-25
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Granted: —
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Expires: 1995-11-25
Abstract
Abstract PURPOSE: A number of detection elements are arranged in parallel to detect the subject to be irradiated, and at the same time, the equipment which selects specific detection element synchronized with X-ray irradiation scan is installed. In this way, the dislocation image shooting time can be shortened as well as the effect by noise, etc. can be deleted, thus facilitating analysis. COPYRIGHT: (C)1977,JPO&Japio
Inventors
- 👤 Tadashi Fujii
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-05 14:37
CPC Classifications
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