JPS5258489A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Production of semiconductor memory element
Assignee: Hitachi Ltd
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Filing: 1975-11-10
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Granted: —
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Expires: 1995-11-10
Abstract
Abstract PURPOSE:To perform avalanche injection of desired charges into trapping region by forming the charge trapping region through doping of a desired impurity into a gate insulation film by an ion implantation method, and applying a reverse bias voltage between one or both of source and drain regions and the substrate.
Inventors
- 👤 Seiichi Iwamatsu
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-10-30 19:04
CPC Classifications
—
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