JPS51147936A
Expired / Lapsed
JP
⏱️ 0.0 years remaining
Logic circuit testing apparatus
Assignee: NEC Corp
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Filing: 1975-06-13
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Granted: —
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Expires: 1995-06-13
Abstract
Abstract PURPOSE: To practice the testing for logic circuits by low capacity memory units. COPYRIGHT: (C)1976,JPO&Japio
Inventors
- 👤 Tomio Goto
Bibliographic Details
Application Number
—
Jurisdiction
JP
Data Source
google_patents
Last Synchronized
2026-11-05 16:18
CPC Classifications
—
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