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JPH08321197A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor memory device

Assignee: SK Hynix Inc
•
Filing: 1996-02-05
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Granted: —
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Expires: 2016-02-05
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Abstract

Abstract Translated from Japanese (57)【要約】 【課題】 ヒューズROM部における漏れ電流の発生等 を防止することで消費電力の少ない半導体メモリ素子を 提供すること。 【解決手段】 初期状態における外部電源の印加を検出 してこの電源電圧に応じた電源印加信号を出力する外部 電源検出回路10と、この電源印加信号を入力してこれ に応じた制御信号を出力するゲート制御回路20と、こ の制御信号によりオン・オフを行うスイッチとヒューズ とが電源VCCとこれより電源VSS間に直列接続さ れ、このヒューズが切断されているか否かをノードN2 より出力するROMセル30と、ROMセル30の出力 状態をラッチするラッチ回路40とを有する。ゲート制 御回路20は、電源印加信号の遷移を監視し、外部電源 の電源電圧が安定状態になった後にスイッチを制御して データのラッチが行う。 (57) Abstract: A semiconductor memory device with low power consumption is provided by preventing generation of leakage current in a fuse ROM section. SOLUTION: An external power supply detection circuit 10 which detects application of an external power supply in an initial state and outputs a power supply application signal corresponding to the power supply voltage, and an input of the power supply application signal and outputs a control signal corresponding to the input The gate control circuit 20 that operates, a switch that turns on / off by this control signal, and a fuse are connected in series between the power supply VCC and the power supply VSS, and it is determined whether the fuse is cut or not at the node N2. It has a ROM cell 30 that outputs more, and a latch circuit 40 that latches the output state of the ROM cell 30. The gate control circuit 20 monitors the transition of the power supply applied signal, and controls the switch to latch the data after the power supply voltage of the external power supply becomes stable.

Inventors

  • 👤 Yang-Sung Joo
  • 👤 スン ジョ ヤン

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-31 14:45
CPC Classifications
G; G11; G11C; G11C17/00; G11C29/00; G11C29/70; G11C29/78; G11C29/785; G11C29/789; G11C17/14; G11C17/18; G11C29/83

Claims Analysis

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References Cited (Backward Citations)

JPH05242691A Cited

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