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JPH055688A Expired / Lapsed JP ⏱️ 0.0 years remaining

Cold heat shock test device

Assignee: Daikin Industries Ltd
•
Filing: 1991-06-04
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Granted: —
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Expires: 2011-06-04
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Abstract

Abstract Translated from Japanese (57)【要約】 【目的】 冷熱衝撃試験装置において、高温槽(2)に 設けた加熱ヒータ(4)と低温槽(3)に設けた冷却器 (6)の蓄熱又は蓄冷のための作動を無駄なく効率的に 行わせる。 【構成】 加熱ヒータ(4)を、高温さらし終了後、高 温さらし設定温度と低温さらし設定時間との組合せによ り予め設定された0を含む所要停止時間の停止の後、蓄 熱のために作動させ、かつ冷却器(6)を低温さらし終 了後、低温さらし設定温度と高温さらし設定時間との組 合せにより予め設定された0を含む所要停止時間の停止 後、蓄冷のために作動させる構成とする。 (57) [Abstract] [Purpose] In the thermal shock test equipment, the heater (4) provided in the high temperature tank (2) and the cooler (6) provided in the low temperature tank (3) for heat storage or operation. To be done efficiently and efficiently. [Structure] The heating heater (4) is operated for heat storage after the termination of a required stop time including 0 preset by a combination of a high temperature exposure set temperature and a low temperature exposure set time after completion of high temperature exposure. Moreover, after the low temperature exposure of the cooler (6) is finished, the cooler (6) is stopped for a required stop time including 0 preset by a combination of the low temperature exposure set temperature and the high temperature exposure set time, and then is operated for storing cold.

Inventors

  • 👤 Takashi Tanaka
  • 👤 隆 田中
  • 👤 Rikiya Fujiwara
  • 👤 力弥 藤原

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-05 17:25
CPC Classifications
—

Claims Analysis

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References Cited (Backward Citations)

JPH02186243A Cited

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