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JPH0545274A Expired / Lapsed JP ⏱️ 0.0 years remaining

Particle measuring device

Assignee: Japan Science and Technology Agency
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Filing: 1991-08-13
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Granted: —
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Expires: 2011-08-13
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Abstract

Abstract Translated from Japanese (57)【要約】 【構成】 複数の光センサを直接に、または光導体ファ イバによって間接的に直列配置したセンサ部を粒子の飛 散方向に対して垂直に少なくとも2組平行配設し、これ らセンサ部をリアルタイム信号処理装置と連結してなる 粒子測定装置。 【効果】 粒子群をジェット噴流により高速に飛散さ せ、一次粒子化させた後、この影像をリアルタイム画像 処理システムにより取り込み処理行なうことにより、粒 子群の形状および粒度分布を高効率、高精度で把握する ことができる。 (57) [Summary] [Structure] At least two sensor units, each of which has a plurality of optical sensors directly or indirectly arranged in series by a light guide fiber, are arranged in parallel in a direction perpendicular to the direction of particle scattering. Particle measuring device in which the unit is connected to a real-time signal processing device. [Effect] Particles are scattered at high speed by a jet jet to form primary particles, and then this image is captured by a real-time image processing system, and the shape and particle size distribution of particles are grasped with high efficiency and accuracy. can do.

Inventors

  • 👤 Mitsuo Kamiwano
  • 👤 満雄 上和野

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 03:23
CPC Classifications
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