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JPH0474464A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor device

Assignee: Panasonic Holdings Corp
•
Filing: 1990-07-16
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Granted: —
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Expires: 2010-07-16
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Abstract

Abstract PURPOSE:To constitute a protective circuit having a large surge resistance by using a diode which uses a terminal which electrically connects a gate electrode to a high-concentration area of the first conductivity as an anode and a terminal led out from another area of the second conductivity as a cathode as a surge protective element. CONSTITUTION:A gate electrode 3 of a polycrystalline silicon film is formed on a P-type semiconductor substrate 1 with a silicon oxide film 2 having a thickness of 500Angstrom in between. An P-type and N-type areas 4 and 5 and are respectively formed in the substrate 1 on both sides of the electrode 3. Then a diode is formed by forming an anode 7 by electrically connecting the electrode 3 with the electrode 6 of the high-concentration P-type area 5 and a cathode 9 by using the electrode 8 of the N-type area 4. When a negative surge voltage is applied across the cathode 9, a forward bias is applied to the diode and the surge is absorbed. When a reverse bias, namely, a positive surge voltage is applied across the cathode 9, the breakdown of the diode necessarily occurs at the junction between the N-type area 5 and P-type semiconductor substrate 1 below the gate electrode 3.

Inventors

  • 👤 Yuji Yamanishi
  • 👤 山西 雄司
  • 👤 Hiroshi Tanida
  • 👤 宏 谷田

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-10-30 13:52
CPC Classifications
H; H10; H10D; H10D8/00

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

JPS54140880A Cited
JPS5724566A Cited

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