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JPH0338833A Expired / Lapsed JP ⏱️ 0.0 years remaining

Wiring correction apparatus

Assignee: NEC Corp
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Filing: 1989-07-05
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Granted: —
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Expires: 2009-07-05
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Abstract

Abstract PURPOSE:To execute a cutting operation of an Al wiring, an opening operation of a protective film on the Al wiring and a drawing operation of a W wiring by using a focused laser beam by a method wherein a focused laser beam mechanism and a focused ion beam mechanism are assembled in one apparatus. CONSTITUTION:A focused laser beam optical system 1 and a focused ion beam optical system 8 are installed on an identical chamber 21. The focused ion beam optical system 8 and the chamber 21 are not separated spatially so that ions extracted from the focused ion beam optical system 8 can reach a specimen 5; a vacuum can be evacuated uniformly. In addition, the focused ion beam optical system and the chamber are separated by a transparent window. A specimen stage 4 on which the specimen 5 is placed is installed inside the chamber 21; the specimen stage 4 can be moved between a part directly under the focused laser beam optical system 1 and a part directly under the focused ion beam optical system 8. Thereby, a cutting operation of an Al wiring an opening operation of a protective film on the Al wiring and a drawing operation of a W wiring can be executed in a good shape, at a high success rate and in a short time.

Inventors

  • 👤 Kohei Eguchi
  • 👤 江口 公平

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 14:20
CPC Classifications
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