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JPH03280294A Expired / Lapsed JP ⏱️ 0.0 years remaining

Memory cell circuit for semiconductor integrated circuit device

Assignee: Mitsubishi Electric Corp
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Filing: 1990-03-28
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Granted: —
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Expires: 2010-03-28
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Abstract

Abstract PURPOSE:To remove useless transistors (TRs) on a gate array and to easily execute layout design by using the same number of N-channle MOS TRs and P-channel MOS TRs. CONSTITUTION:The above memory cell circuit consists of two inverter circuits 1a, 1b, two N-channel MOS TRs 2a, 2b and two P-channel MOS TRs 3c, 3d and the outputs of respectively inverter circuits 1a, 1b are mutually connected to the inputs of the other inverters 1b, 1a to constitute a data holding loop. The memory cell circuit can be constituted of four N-channel MOS TRs and four P-channel MOS TRs. Thereby, when a word line, the inverse of WL2, is set up to an 'L' level, the P-channel MOS TRs 3c, 3d are turned on and data are read out to bit wire pair BIT2, the inverse of BIT2.

Inventors

  • 👤 Hideshi Maeno
  • 👤 秀史 前野

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-07 14:46
CPC Classifications
G; G11; G11C; G11C8/00; G11C8/16; H; H10; H10D; H10D84/00; H10D84/90; H10D84/903; H10D84/907

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