Output pulse inspection circuit of ic

Abstract

Abstract PURPOSE:To shorten an inspection time by generating the first strobe pulse so as to allow the same to coincide with the shortest time limit of a tolerance range of H or L with respect to the output pulse of the output terminal of an IC and generating the second strobe pulse immediately after the longest time limit of the tolerance range to detect the states of two strobe signals. CONSTITUTION:A strobe pulse generating circuit 7 generates the first strobe pulse S1 in the timing coinciding with the shortest time limit of a tolerance range of 'H' or 'L' with respect to the output pulse generated at the output terminal DOUT of an IC 2 and also generates the second strobe pulse S2 in the timing immediately after the longest time limit of the tolerance range. Subsequently, a judging circuit 8 detects whether the output pulse is in an 'H' or 'L' state corresponding to the first and second strobe pulses S1, S2 and the detected state is compared with the state suitable for specifications by a comparing circuit 5.

Inventors

• 👤 Shigemitsu Yoshii
• 👤 吉井　重光

Bibliographic Details