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JPH0247536A Expired / Lapsed JP ⏱️ 0.0 years remaining

Measuring method of suspended particulate in gas and apparatus therefor

Assignee: Ebara Research Co Ltd
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Filing: 1988-08-09
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Granted: —
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Expires: 2008-08-09
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Abstract

Abstract PURPOSE:To execute precise measurement in a wide range of measuring concentration by applying an ultraviolet ray to a photoelectron emitting material, by charging particulates with photoelectrons thus generated, and by sorting the charged particulates with an impression voltage varied. CONSTITUTION:Air 1 containing suspended particulates wherefrom large particles of 10mum or above are removed is introduced from an introduction port, and the particulates contained therein are charge, in a charging part A1, with photoelectron s emitted from a photoelectron emitting surface 3 which is subjected to the irradiation of an ultraviolet ray from an ultraviolet ray irradiation source 2. The particulates charged by the charging part A1 are sorted in a charged particulate sorting part B1 having a function of sorting the charged particulates by varying an impression voltage between sorting plates 7 and 8. Detection of the charged particulates sorted in the sorting part B1 is executed by an electrometer 9 in a detecting part C1 of the charged particulates.

Inventors

  • 👤 Toshiaki Fujii
  • 👤 敏昭 藤井
  • 👤 Kazuhiko Sakamoto
  • 👤 和彦 坂本

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-08 06:43
CPC Classifications
—

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References Cited (Backward Citations)

JPS6117045A Cited
JPS62242834A Cited

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