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JPH02309681A Expired / Lapsed JP ⏱️ 0.0 years remaining

Semiconductor nonvolatile memory

Assignee: Seiko Instruments Inc
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Filing: 1989-05-24
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Granted: —
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Expires: 2009-05-24
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Abstract

Abstract PURPOSE:To make possible a writing by a supply voltage and to prevent a soft write at the time of readout by a method wherein an injection of hot electrons and the writing are performed between second and third channel regions and a drain region is formed into a thin drain region. CONSTITUTION:A channel region is constituted of first and third channel regions, which are respectively controlled by floating gates 9, and a second channel region which is controlled by a selective gate electrode 13. Moreover, a tunnel insulating film (a drain region) 8 is formed between a drain region 3 and the electrode 9, hot electrons are injected between the second and third channel regions to perform a writing and an erase is performed taking out the electrons form the electrode 9 to the region 3 by applying a high voltage to the drain region. Thereby, a memory is actuated by a supply voltage only and moreover, a soft write at the time of readout can be prevented.

Inventors

  • 👤 Yoshikazu Kojima
  • 👤 芳和 小島

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-03 09:06
CPC Classifications
—

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