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JPH02202085A Expired / Lapsed JP ⏱️ 0.0 years remaining

Manufacture of semiconductor laser device

Assignee: Mitsubishi Electric Corp
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Filing: 1989-01-31
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Granted: —
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Expires: 2009-01-31
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Abstract

Abstract PURPOSE:To protect the regrown interface against oxidation by a method wherein an etching stopper layer left at the etching of a current flow path groove is melted back, the surface of a clad layer at the groove is exposed when a cap layer is made to grow, and the cap layer and a contact layer are successively grown thereon. CONSTITUTION:An oxidation preventive GaAs layer 10 is left in thin film on the base of a current flow path 6 provided to a first conductivity type AlpGa1-pAs current block layer 11 which has been grown in a first epitaxial crystal growth process. When a second conductivity type AlzGa1-zAs cap layer 7 is grown without exposing a second conductivity type AlzGa1-zAs upper clad layer 4, only the oxidation preventive GaAs layer 10 is melted back to remove through a liquid phase epitaxial method. Thereafter, the second conductivity type AlzGa1-zAs cap layer 7 and a second conductivity type GaAs contact layer 8 are successively formed. By this setup, a regrown interface can be protected against oxidation.

Inventors

  • 👤 Koji Yamashita
  • 👤 山下 光二
  • 👤 Masato Okada
  • 👤 真人 岡田
  • 👤 Misao Hironaka
  • 👤 美佐夫 廣中

Bibliographic Details

Application Number —
Jurisdiction JP
Data Source google_patents
Last Synchronized 2026-11-09 05:15
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/20; H01S5/22; H01S5/2205; H01S5/2206; H01S5/221; H01S5/223; H01S5/2231; H01S5/30; H01S5/32; H01S5/323; H01S5/32308

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