Circuit device for measuring delay of element

Abstract

Abstract PURPOSE:To measure the delay time of an element by storing input signals which are successively outputted with prescribed delay time and change from a 1st level to a 2nd level at the changing moments and observing the delay time from the changing moments to the next changing moments. CONSTITUTION:A latch input terminal 4 inputs and fetches signals to elements 12a-12h to be measured and storage elements 6q-6n. When all output terminals 7a-7h output '0', '1' is inputted to a reset input terminal 5 and, when a terminal 4 inputs a change from '0' to '1' thereafter, the element 12a outputs '1' after the lapse of certain time. Then successively inputted signal changes are propagated to the elements 12b-12h. When a signal change from '1' to '0' is given to the terminal 4 at the time when the output of the element 12d changes from '0' to '1', FFs 6a-6h store the output signals of the elements 12a-12h. When the output value of the terminals 7a-7h are observed and it is checked that up to which output terminals from the 7a output '1' signals after the signal changes from '0' to '0' through '1' are given to the terminal 4 within a fixed time 1, the delay time of delay elements of one stage can be found.

Inventors

• 👤 Hiroki Sakurai
• 👤 櫻井　博樹

Bibliographic Details