Time division multiplexer

Abstract

Abstract PURPOSE:To attain loopback test with high reliability by providing part of a loopback test function in a terminal interface module. CONSTITUTION:A test pattern generating section 22 and a test pattern collation section 23 are connected to a loopback circuit 10 in a terminal interface module 5. A test pattern generated from the test pattern generating section 22 is given externally from a driver section of a terminal interface circuit 9 and it is looped back by a loopback connector provided in other terminal interface circuit and enters again the terminal interface from a receiver section of the terminal interface circuit 9 and is collated by a test pattern collation section 23.

Inventors

• 👤 Seiji Komai
• 👤 駒井　誠二

Bibliographic Details